Instruments for X-ray Analysis: Call for Papers
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Instruments for X-ray Analysis: Call for Papers

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Focusing X-ray Optics and Their Applications

Call for Papers

The X-rays can be focused by their interaction with matter. There are several focusing X-ray optics which can provide a microbeam or a quasi-parallel beam. Such optics may be divided into main categories such as diffractive optics, refractive optics, and reflective optics. Focusing X-ray optics have played an important role in the X-ray technology, such as X-ray diffraction, X-ray fluorescence, X-ray absorption fine structure, X-ray imaging, X-ray lithography, and so on. This important role of the focusing X-ray optics will be stronger with the development of the X-ray technology.

We invite authors to submit original research articles as well as review articles that seek the study on the design, performances, and applications of the focusing X-ray optics. We are interested in articles on the applications of the focusing X-ray optics in such realms which cause public concern as environmental, biology, medicine, food, and so on. Potential topics include, but are not limited to:

·                     Fabrication of focusing X-ray optics

·                     Characterization of focusing X-ray optics

·                     Application of focusing X-ray optics based on conventional laboratory X-ray sources

·                     Application of focusing X-ray optics based on synchrotron radiation

Before submission authors should carefully read over the journal's Author Guidelines, which are located at http://www.hindawi.com/journals/xroi/guidelines/. Prospective authors should submit an electronic copy of their complete manuscript through the journal Manuscript Tracking System at http://mts.hindawi.com/ according to the following timetable:

Manuscript Due

Friday, 6 January 2012

First Round of Reviews

Friday, 6 April 2012

Publication Date

Friday, 6 July 2012

Lead Guest Editor

  • Tianxi Sun, College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, China; Center for X-Ray Optics, University at Albany, SUNY, Albany, NY 12222, USA

Guest Editors

  • Aniouar Bjeoumikhov, IfG Institute for Scientific Instruments GmbH, Rudower Chaussee 29/31, 12489 Berlin, Germany
  • A. Yu. Romanov, X-ray-tubes.biz Inc., 141212 Moscow, Russia
  • Jay Cremer, Adelphi Technology, Inc., Redwood City, CA� 94063, USA

 

 

http://www.hindawi.com/journals/xroi/si/xrop/